TSA, American Airlines to introduce 3D scan technology for carry-on bags

Published on : Friday, December 28, 2018

American Airlines is ready to introduce a brand new imaging technology to its security checkpoint in JFK Airport in New York that might help accelerate the screening process.


As per a joint release that was published between the airline and the Transportation Security Administration (TSA), American is trialing a new type of 3D X-ray scanner that would give screening staff better and more comprehensive images of carry-on bags.


The resulting images should better-help screeners identify materials and cut down on flagged bags that deserve a manual search.


This unique technology that is offered by analogic, utilizes Computed Tomography or CT to produce 3D images of every scanned bag. This technology that has been employed by the healthcare industry for years that has already been deployed to scan checked bags in most airports but then owing to size constraint has been so far not been widely integrated at passenger screening checkpoints.


The latest scanning tools from analogic seem to rectify the footprint issues.


CT’s advantages over traditional 2D X-rays, which are currently used at most checkpoints, are significant.


This is because CT provides volumetric information rather than projection information as per Dr. Arjun Sharma, a radiologist at AMITA Hinsdale Hospital in Illinois and associate editor of the Journal of Digital Imaging.


He then went on to add that the new technology removes the problem of overlapping objects and instead tells the observer the exact density of material at any point in space. In fact, he asserted that the observer knows the shape and material of every object scanned.

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